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Alvin Wayne Strong
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Reliability wearout mechanisms in advanced CMOS technologies
Alvin Wayne Strong, Alvin W. Strong, Ernest Y. Wu, Rolf-peter Vollertsen, Jordi Sune, Guiseppe La Rosa · IEEE Press
624 sayfa · 2008
Complementary Metal oxide semiconductors / Reliability / CMOS-Schaltung / Schaltungsentwurf / Circuits & components