Yazar
Christophe Gorecki
16 cilt bulundu.
Christophe Gorecki · SPIE
210 sayfa · 2003
Microelectromechanical systems / Mensuration / Industrial applications / Microelectronics / Optical methods
Christophe Gorecki · Yayınevi bilinmiyor
484 sayfa · 1994
Optical methods / Quality control / Congresses / Optical measurements / Optical detectors
Christophe Gorecki · SPIE
846 sayfa · 1997
Congresses / Optical measurements / Optical detectors / Engineering inspection / Industrial applications
Christophe Gorecki · SPIE
176 sayfa · 2001
Microelectromechanical systems / Industrial applications / Microelectronics / Optical methods / Quality control
Christophe Gorecki · SPIE
186 sayfa · 1999
Microelectromechanical systems / Mensuration / Congresses / Interferometry / Optical instruments
Wolfgang Osten, Christophe Gorecki · SPIE
326 sayfa · 2006
Mensuration / Congresses / Industrial applications / Interferometry / Measurement
Christophe Gorecki, Anand Asundi · SPIE
300 sayfa · 2004
Congresses / Industrial applications / Optical measurements
Christophe Gorecki · SPIE
Sayfa sayısı yok · 2006
Photonics / Congresses / Metrology / Microscopy / Optical measurements
Christophe Gorecki · SPIE--International Society for Optical Engineering
846 sayfa · 1996
Congresses / Optical measurements / Optical detectors / Engineering inspection / Industrial applications
Christophe Gorecki · SPIE
Sayfa sayısı yok · 2010
Photonics / Congresses / Metrology / Microscopy / Optical measurements
Christophe Gorecki · SPIE
Sayfa sayısı yok · 2008
Congresses / Metrology / Optical measurements / Photonics / Industrial applications
Wolfgang Osten, Christophe Gorecki · SPIE
Sayfa sayısı yok · 2008
Interferometry / Congresses / Industrial applications / Measurement
Wolfgang Osten, Christophe Gorecki · SPIE
Sayfa sayısı yok · 2007
Optical methods / Quality control / Congresses / Optical detectors / Optical instruments
Christophe Gorecki, Anand Asundi, Wolfgang Osten · SPIE
442 sayfa · 2014
Optical measurements / Microscopy / Meteorology
Christophe Gorecki, Anand K Asundi, Wolfgang Osten · SPIE
432 sayfa · 2012
Optical measurements / Microscopy / Photonics / Metrology