Yazar
Do Yeung Yoon
2 cilt bulundu.
Cilt sonuçları
Materials, processes, integration and reliability in advanced interconnects for micro- and nanoelectronics
E. Todd Ryan, Wen-li Wu, Do Yeung Yoon · Materials Res Soc
338 sayfa · 2007
Materials / Congresses / Nanoelectronics / Very large scale integration / Microelectronics
Materials, Processes, Integration and Reliability in Advanced Interconnects for Micro- And Nanoelectronics
Qinghuang Lin, E. Todd Ryan, Wen-li Wu, Do Yeung Yoon · University of Cambridge ESOL Examinations
358 sayfa · 2014
Integrated circuits, very large scale integration / Microelectronics / Materials / Nanotechnology