Yazar
eishi ibe
4 cilt bulundu.
Cilt sonuçları
Environmental Radiation Effects in ULSI Devices and Electronic Systems
Eishi H. Ibe · John Wiley & Sons Inc
Sayfa sayısı yok · 2013
Integrated circuits, ultra large scale integration / Radiation, safety measures / Environmental protection / Electronic circuits / Effect of radiation on
Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Eishi H. Ibe · Wiley & Sons, Incorporated, John
296 sayfa · 2014
Integrated circuits, ultra large scale integration / Radiation, safety measures / Environmental protection
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Takashi Nakamura, Mamoru Baba, Eishi Ibe · World Scientific Publishing Co Pte Ltd
Sayfa sayısı yok · 2008
Kategori yok
Terrestrial Neutron-Induced Soft Error in Advanced Memory Devices
Takashi Nakamura, Mamoru Baba, Eishi Ibe · World Scientific Publishing Co Pte Ltd
Sayfa sayısı yok · 2008
Kategori yok