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Manoj Sachdev

8 cilt bulundu.

Cilt sonuçları

Defect oriented testing for CMOS analog and digital circuits

308 sayfa · 1998

Complementary Metal oxide semiconductors / Defects / Digital integrated circuits / Linear integrated circuits / Metal oxide semiconductors, Complementary

Thermal and Power Management of Integrated Circuits

Arman Vassighi, Manoj Sachdev · Springer

179 sayfa · 2006

Systems engineering / Computer engineering / Engineering design / Computer-aided design / Engineering

Defect-oriented testing for nano-metric CMOS VLSI circuits

Manoj Sachdev, José Pineda de Gyvez · Springer

328 sayfa · 2007

Complementary Metal oxide semiconductors / Very large scale integration / Testing / Defects / Integrated circuits

Thermal and Power Management of Integrated Circuits (Integrated Circuits and Systems)

Arman Vassighi, Manoj Sachdev · Springer

182 sayfa · 2006

Integrated circuits

Thermal and Power Management of Integrated Circuits

Arman Vassighi, Manoj Sachdev · Springer

192 sayfa · 2010

Integrated circuits

2000 IEEE International Workshop on Defect Based Testing

IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal · IEEE Computer Society

84 sayfa · 2000

Complementary Metal oxide semiconductors / Congresses / Defects / Iddq testing / Integrated circuits

ElectronicsCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled TechnologiesAndrei Pavlov, Manoj Sachdev

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Andrei Pavlov, Manoj Sachdev · Springer

194 sayfa · 2010

Metal oxide semiconductors, complementary / Computer storage devices / Electronics

CiltDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd EdtionManoj Sachdev and Jose Pineda de Gyvez

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edtion

Manoj Sachdev and Jose Pineda de Gyvez · Springer

358 sayfa · 2007

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