Yazar
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20 cilt bulundu.
Cilt sonuçları
Terrestrial Neutron-induced Soft Error In Advanced Memory Devices
Takashi Nakamura, Eishi Ibe, Mamoru Baba, Yasuo Yahagi, Hideaki Kameyama · World Scientific
364 sayfa · 2008-03-28
Science
Dependability in Electronic Systems
Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu · Springer Science & Business Media
226 sayfa · 2010-11-08
Technology & Engineering
