Yazar
Gwan Seung Choi
1 cilt bulundu.
Cilt sonuçları
Fault-sensitivity and wear-out analysis of VLSI sensitivity
Gwan Seung Choi · Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign
Sayfa sayısı yok · 1994
Chips (Electronics) / Failure analysis / Monte Carlo method / Statistical analysis / Switching circuits