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john r devaney
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Failure analysis mechanisms techniques & photo atlas
John R. Devaney · Failure Recognition & Training Services
Sayfa sayısı yok · 1983
System failures / System failures (Engineering)
Notes on SEM examination of microelectronic devices
John R. Devaney · U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Doc., U.S. Govt. Print. Off.
48 sayfa · 1977
Miniature electronic equipment / Scanning electron microscopy / Semiconductors / Testing / Scanning electron microscopes