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Lawrence Joseph Sykes
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The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
Lawrence Joseph Sykes · Yayınevi bilinmiyor
225 sayfa · 1981
Electron microscopy / Transmission electron microscopes / Defects / Crystals
Mythic #9
Shaun Kilgore, John Michael Greer, Fredrick Obermeyer, Kathryn Yelinek, Lawrence Buentello, L. Joseph Shosty, Greg Belvedere, D. A. D'Amico, M. Michelle Bardon, John Sykes · Founders House Publishing LLC
114 sayfa · 2019
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