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manoj m k menon
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2000 IEEE International Workshop on Defect Based Testing
IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal · IEEE Computer Society
84 sayfa · 2000
Complementary Metal oxide semiconductors / Congresses / Defects / Iddq testing / Integrated circuits