Yazar
sankaran m menon
2 cilt bulundu.
Cilt sonuçları
2000 IEEE International Workshop on Defect Based Testing
IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon, Quebec) IEEE VLSI Test Symposium (2000 : Montreal · IEEE Computer Society
84 sayfa · 2000
Complementary Metal oxide semiconductors / Congresses / Defects / Iddq testing / Integrated circuits
1998 IEEE International Workshop on IDDQ Testing
IEEE International Workshop on IDDQ Testing (4th 1998 San Jose, California), California) IEEE International Workshop on IDDQ Testing (4th : 1998 : San Jose, Sankaran M. Menon, Yashwant K. Malaiya · Institute of Electrical & Electronics Enginee
82 sayfa · 1998
Complementary Metal oxide semiconductors / Congresses / Iddq testing / Metal oxide semiconductors, Complementary / Testing