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Rajeshuni Ramesham

11 cilt bulundu.

Cilt sonuçları

Reliability, testing, and characterization of MEMS/MOEMS III

Rajeshuni Ramesham · SPIE

312 sayfa · 2004

Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronics

Reliability, packaging, testing, and characterization of MEMS/MOEMS IV

Rajeshuni Ramesham · SPIE

220 sayfa · 2005

Reliability / Microelectromechanical systems / Testing / Congresses / Optoelectronic devices

Reliability, testing, and characterization of MEMS/MOEMS II

Rajeshuni Ramesham · SPIE

334 sayfa · 2003

Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronics

Reliability, testing, and characterization of MEMS/MOEMS

Rajeshuni Ramesham · SPIE

296 sayfa · 2001

Reliability / Microelectromechanical systems / Testing / Congresses

MEMS reliability for critical and space applications

William M. Miller, Rajeshuni Ramesham · SPIE

176 sayfa · 1999

Microelectromechanical systems / Reliability / Congresses

ReliabilityReliability, Packaging, Testing, and Characterization of MEMS/MOEMS VRajeshuni Ramesham

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V

Rajeshuni Ramesham · SPIE-International Society for Optical Engine

1 sayfa · 2006

Microelectronics / Electromechanical devices / Microelectromechanical systems / Congresses / Reliability

Microelectronic packagingReliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XISonia Garcia-Blanco, Rajeshuni Ramesham

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices XI

Sonia Garcia-Blanco, Rajeshuni Ramesham · SPIE

Sayfa sayısı yok · 2012

Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronic packaging

CiltReliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIIIHerbert R. Shea, Rajeshuni Ramesham

Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII

Herbert R. Shea, Rajeshuni Ramesham · SPIE

216 sayfa · 2014

Kategori yok

Microelectronic packagingReliability, packaging, testing, and characterization of MEMS/MOEMS VIAllyson L. Hartzell, Rajeshuni Ramesham

Reliability, packaging, testing, and characterization of MEMS/MOEMS VI

Allyson L. Hartzell, Rajeshuni Ramesham · SPIE

Sayfa sayısı yok · 2007

Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronic packaging

Microelectronic packagingReliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IXRichard C. Kullberg, Rajeshuni Ramesham

Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IX

Richard C. Kullberg, Rajeshuni Ramesham · SPIE

Sayfa sayısı yok · 2010

Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronic packaging

Microelectronic packagingReliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIIIRichard C. Kullberg, Rajeshuni Ramesham, SPIE, Texas Instruments Incorporated Staff

Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII

Richard C. Kullberg, Rajeshuni Ramesham, SPIE, Texas Instruments Incorporated Staff · SPIE

180 sayfa · 2009

Microelectromechanical systems / Congresses / Reliability / Testing / Microelectronic packaging