Yazar
richard c kullberg
2 cilt bulundu.
Cilt sonuçları
Reliability, packaging, testing, and characterization of MEMS/MOEMS and nanodevices IX
Richard C. Kullberg, Rajeshuni Ramesham · SPIE
Sayfa sayısı yok · 2010
Reliability / Microelectromechanical systems / Testing / Congresses / Microelectronic packaging
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices VIII
Richard C. Kullberg, Rajeshuni Ramesham, SPIE, Texas Instruments Incorporated Staff · SPIE
180 sayfa · 2009
Microelectromechanical systems / Congresses / Reliability / Testing / Microelectronic packaging